Palkesh Jain, D. Vinay Kumar, J. M. Vasi, Mahesh B. Patil. Evaluation of Non-Quasi-Static Effects during SEU in Deep-Submicron MOS Devices and Circuits. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 188-193, IEEE Computer Society, 2006. [doi]
Abstract is missing.