Najmi T. Jarwala, Paul W. Rutkowski, Shianling Wu, Chi W. Yau. Lessons Learned from Practical Applications of BIST/B-S Technology. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 251-257, IEEE Computer Society, 1996. [doi]
Abstract is missing.