Jiri Jenícek, Ondrej Novák. Test Pattern Compression Based on Pattern Overlapping. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 29-34, IEEE Computer Society, 2007.
Abstract is missing.