Keith A. Jenkins, Anup P. Jose, David F. Heidel. An on-chip jitter measurement circuit with sub-picosecond resolution. In Laurent Fesquet, Andreas Kaiser, Sorin Cristoloveanu, Michel Brillouët, editors, Proceedings of the 31st European Solid-State Circuits Conference, ESSCIRC 2005, Grenoble, France, 12-16 September 2005. pages 157-160, IEEE, 2005. [doi]
@inproceedings{JenkinsJH05, title = {An on-chip jitter measurement circuit with sub-picosecond resolution}, author = {Keith A. Jenkins and Anup P. Jose and David F. Heidel}, year = {2005}, doi = {10.1109/ESSCIR.2005.1541583}, url = {https://doi.org/10.1109/ESSCIR.2005.1541583}, researchr = {https://researchr.org/publication/JenkinsJH05}, cites = {0}, citedby = {0}, pages = {157-160}, booktitle = {Proceedings of the 31st European Solid-State Circuits Conference, ESSCIRC 2005, Grenoble, France, 12-16 September 2005}, editor = {Laurent Fesquet and Andreas Kaiser and Sorin Cristoloveanu and Michel Brillouët}, publisher = {IEEE}, isbn = {0-7803-9205-1}, }