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An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer

Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang. An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(12):2014-2026, 2010. [doi]

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Woosik Jeong

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Joohwan Lee

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Taewoo Han

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Kaangchil Lee

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Sungho Kang

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