Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang. An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(12):2014-2026, 2010. [doi]
@article{JeongLHLK10,
title = {An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer},
author = {Woosik Jeong and Joohwan Lee and Taewoo Han and Kaangchil Lee and Sungho Kang},
year = {2010},
doi = {10.1109/TCAD.2010.2062830},
url = {http://dx.doi.org/10.1109/TCAD.2010.2062830},
tags = {analysis},
researchr = {https://researchr.org/publication/JeongLHLK10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {29},
number = {12},
pages = {2014-2026},
}