Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology

Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, T. Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S.-H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, G. H. Koh, K. C. Park, S. Pae, G. T. Jeong, J.-S. Yoon, E. S. Jung. Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-3, IEEE, 2019. [doi]

Authors

Y. Ji

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H. J. Goo

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J. Lim

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S. B. Lee

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S. Lee

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T. Uemura

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J. C. Park

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S. I. Han

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S. C. Shin

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J. H. Lee

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Y. J. Song

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K. M. Lee

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H. M. Shin

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S.-H. Hwang

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B. Y. Seo

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Y. K. Lee

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J. C. Kim

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G. H. Koh

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K. C. Park

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S. Pae

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G. T. Jeong

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J.-S. Yoon

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E. S. Jung

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