Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, T. Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S.-H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, G. H. Koh, K. C. Park, S. Pae, G. T. Jeong, J.-S. Yoon, E. S. Jung. Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-3, IEEE, 2019. [doi]
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