Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, T. Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S.-H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, G. H. Koh, K. C. Park, S. Pae, G. T. Jeong, J.-S. Yoon, E. S. Jung. Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-3, IEEE, 2019. [doi]
@inproceedings{JiGLLLUPHSLSLSH19,
title = {Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology},
author = {Y. Ji and H. J. Goo and J. Lim and S. B. Lee and S. Lee and T. Uemura and J. C. Park and S. I. Han and S. C. Shin and J. H. Lee and Y. J. Song and K. M. Lee and H. M. Shin and S.-H. Hwang and B. Y. Seo and Y. K. Lee and J. C. Kim and G. H. Koh and K. C. Park and S. Pae and G. T. Jeong and J.-S. Yoon and E. S. Jung},
year = {2019},
doi = {10.1109/IRPS.2019.8720429},
url = {https://doi.org/10.1109/IRPS.2019.8720429},
researchr = {https://researchr.org/publication/JiGLLLUPHSLSLSH19},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}