ESD characterization of planar InGaAs devices - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Z. Ji, Dimitri Linten, R. Boschke, Geert Hellings, S. H. Chen, A. Alian, D. Zhou, Y. Mols, Tsvetan Ivanov, Jacopo Franco, Ben Kaczer, X. Zhang, R. Gao, J. F. Zhang, W. Zhang, Nadine Collaert, Guido Groeseneken. ESD characterization of planar InGaAs devices. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 3, IEEE, 2015. [doi]

This author has not been identified. Look up 'Z. Ji' in GoogleThis author has not been identified. Look up 'Dimitri Linten' in GoogleThis author has not been identified. Look up 'R. Boschke' in GoogleThis author has not been identified. Look up 'Geert Hellings' in GoogleThis author has not been identified. Look up 'S. H. Chen' in GoogleThis author has not been identified. Look up 'A. Alian' in GoogleThis author has not been identified. Look up 'D. Zhou' in GoogleThis author has not been identified. Look up 'Y. Mols' in GoogleThis author has not been identified. Look up 'Tsvetan Ivanov' in GoogleThis author has not been identified. Look up 'Jacopo Franco' in GoogleThis author has not been identified. Look up 'Ben Kaczer' in GoogleThis author has not been identified. Look up 'X. Zhang' in GoogleThis author has not been identified. Look up 'R. Gao' in GoogleThis author has not been identified. Look up 'J. F. Zhang' in GoogleThis author has not been identified. Look up 'W. Zhang' in GoogleThis author has not been identified. Look up 'Nadine Collaert' in GoogleThis author has not been identified. Look up 'Guido Groeseneken' in Google

runs on WebDSL