Z. Ji, Dimitri Linten, R. Boschke, Geert Hellings, S. H. Chen, A. Alian, D. Zhou, Y. Mols, Tsvetan Ivanov, Jacopo Franco, Ben Kaczer, X. Zhang, R. Gao, J. F. Zhang, W. Zhang, Nadine Collaert, Guido Groeseneken. ESD characterization of planar InGaAs devices. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 3, IEEE, 2015. [doi]
Abstract is missing.