A novel TSV probing technique with adhesive test interposer

Li Jiang, Xiangwei Huang, Hongfeng Xie, Qiang Xu, Chao Li, Xiaoyao Liang, Huiyun Li. A novel TSV probing technique with adhesive test interposer. In 33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, NY, USA, October 18-21, 2015. pages 597-604, IEEE Computer Society, 2015. [doi]

Authors

Li Jiang

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Xiangwei Huang

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Hongfeng Xie

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Qiang Xu

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Chao Li

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Xiaoyao Liang

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Huiyun Li

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