Zhongwei Jiang, Zheng Wang, Jing Wang 0006, D. M. H. Walker. Levelized low cost delay test compaction considering IR-drop induced power supply noise. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 52-57, IEEE Computer Society, 2011. [doi]
@inproceedings{JiangWWW11,
title = {Levelized low cost delay test compaction considering IR-drop induced power supply noise},
author = {Zhongwei Jiang and Zheng Wang and Jing Wang 0006 and D. M. H. Walker},
year = {2011},
doi = {10.1109/VTS.2011.5783754},
url = {http://dx.doi.org/10.1109/VTS.2011.5783754},
tags = {testing},
researchr = {https://researchr.org/publication/JiangWWW11},
cites = {0},
citedby = {0},
pages = {52-57},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}