The following publications are possibly variants of this publication:
- Static Compaction of Delay Tests Considering Power Supply NoiseJing Wang, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. M. H. Walker. vts 2005: 235-240 [doi]
- Compact Delay Test Generation with a Realistic Low Cost Fault Coverage MetricZheng Wang, Duncan M. Hank Walker. vts 2009: 59-64 [doi]
- Delay testing considering power supply noise effectsYi-Min Jiang, Angela Krstic, Kwang-Ting Cheng. itc 1999: 181-190
- Power Supply Noise in Delay TestingJing Wang 0006, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger. itc 2006: 1-10 [doi]
- Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test SetsSeongmoon Wang, Xiao Liu, Srimat T. Chakradhar. date 2004: 1296-1301 [doi]
- Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test PatternsSeongmoon Wang, Wenlong Wei. ets 2008: 125-130 [doi]