Zhongwei Jiang, Zheng Wang, Jing Wang 0006, D. M. H. Walker. Levelized low cost delay test compaction considering IR-drop induced power supply noise. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 52-57, IEEE Computer Society, 2011. [doi]
Abstract is missing.