One more time! Increasing fault detection with scan shift capture - researchr publication related

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Hui Jiang, Fanchen Zhang, Yi Sun, Jennifer Dworak. One more time! Increasing fault detection with scan shift capture. In 27th IEEE North Atlantic Test Workshop, NATW 2018, Essex, VT, USA, May 7-9, 2018. pages 1-7, IEEE, 2018. [doi]

The following publications are possibly variants of this publication:

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan ShiftHui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas. et, 39(2):227-243, April 2023. [doi]

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift captureFanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak. itc 2016: 1-10 [doi]

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