The following publications are possibly variants of this publication:
- Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus SignalLe Jin, Degang Chen, Randall L. Geiger. vts 2007: 303-310 [doi]
- Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus SignalLe Jin, Degang Chen, Randall L. Geiger. tim, 58(8):2679-2685, 2009. [doi]
- Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear InputsLe Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger. itc 2003: 218-227 [doi]
- Linearity testing of ADCs using low linearity stimulus and Kalman filteringBharath K. Vasan, Randall L. Geiger, Degang Chen. iscas 2010: 3032-3035 [doi]
- Linearity testing issues of analog to digital convertersTurker Kuyel. itc 1999: 747-756
- Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME)Shravan K. Chaganti, Tao Chen 0006, Yuming Zhuang, Degang Chen. i2mtc 2018: 1-6 [doi]
- USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-TestTao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen. tcas, 65-I(7):2059-2069, 2018. [doi]