Fast Test Generation for Structurally Similar Circuits

Jerin Joe, Nilanjan Mukherjee 0001, Irith Pomeranz, Janusz Rajski. Fast Test Generation for Structurally Similar Circuits. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]

Authors

Jerin Joe

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Nilanjan Mukherjee 0001

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Irith Pomeranz

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Janusz Rajski

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