Jerin Joe, Nilanjan Mukherjee 0001, Irith Pomeranz, Janusz Rajski. Fast Test Generation for Structurally Similar Circuits. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.