Generation of Two-Cycle Tests for Structurally Similar Circuits

Jerin Joe, Nilanjan Mukherjee 0001, Irith Pomeranz, Janusz Rajski. Generation of Two-Cycle Tests for Structurally Similar Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 43(2):694-703, February 2024. [doi]

Abstract

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