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Wen-Ben Jone. Defect Level Estimation of Random and Pseudorandom Testing. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 712-721, IEEE Computer Society, 1991.
Possibly Related PublicationsThe following publications are possibly variants of this publication: Confidence analysis for defect-level estimation of VLSI random testingWen-Ben Jone, K. S. Tsai. todaes, 3(3):389-407, 1998. [doi] Realizing a High Measure of Confidence for Defect Level Analysis of Random TestingParesh Gondalia, Allan Gutjahr, Wen-Ben Jone. itc 1993: 478-487 Realizing a high measure of confidence for defect level analysis of random testing [VLSI]Wen-Ben Jone, Paresh Gondalia, Allan Gutjahr. tvlsi, 3(3):446-450, 1995. [doi]
The following publications are possibly variants of this publication: