Noise immunity improvement in the RESET signal of DDR3 SDRAM memory module

Seung Mo Jung, Jong Hyun Seok, Ho Jin Yoo, Do-Hyung Kim, You Keun Han, Woo-Seop Kim, Joo-Sun Choi, Jun Dong Cho. Noise immunity improvement in the RESET signal of DDR3 SDRAM memory module. In 2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013. pages 343-348, IEEE, 2013. [doi]

Authors

Seung Mo Jung

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Jong Hyun Seok

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Ho Jin Yoo

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Do-Hyung Kim

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You Keun Han

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Woo-Seop Kim

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Joo-Sun Choi

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Jun Dong Cho

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