Seung Mo Jung, Jong Hyun Seok, Ho Jin Yoo, Do-Hyung Kim, You Keun Han, Woo-Seop Kim, Joo-Sun Choi, Jun Dong Cho. Noise immunity improvement in the RESET signal of DDR3 SDRAM memory module. In 2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013. pages 343-348, IEEE, 2013. [doi]
@inproceedings{JungSYKHKCC13,
title = {Noise immunity improvement in the RESET signal of DDR3 SDRAM memory module},
author = {Seung Mo Jung and Jong Hyun Seok and Ho Jin Yoo and Do-Hyung Kim and You Keun Han and Woo-Seop Kim and Joo-Sun Choi and Jun Dong Cho},
year = {2013},
doi = {10.1109/SOCC.2013.6749713},
url = {http://dx.doi.org/10.1109/SOCC.2013.6749713},
researchr = {https://researchr.org/publication/JungSYKHKCC13},
cites = {0},
citedby = {0},
pages = {343-348},
booktitle = {2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013},
publisher = {IEEE},
}