Seung Mo Jung, Jong Hyun Seok, Ho Jin Yoo, Do-Hyung Kim, You Keun Han, Woo-Seop Kim, Joo-Sun Choi, Jun Dong Cho. Noise immunity improvement in the RESET signal of DDR3 SDRAM memory module. In 2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013. pages 343-348, IEEE, 2013. [doi]