Masayuki Kamei, Yoshinori Takao, Koji Eriguchi, Kouichi Ono. Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{KameiTEO14,
title = {Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs},
author = {Masayuki Kamei and Yoshinori Takao and Koji Eriguchi and Kouichi Ono},
year = {2014},
doi = {10.1109/ICICDT.2014.6838598},
url = {http://dx.doi.org/10.1109/ICICDT.2014.6838598},
researchr = {https://researchr.org/publication/KameiTEO14},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014},
publisher = {IEEE},
isbn = {978-1-4799-2153-9},
}