A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type - researchr publication authors

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Michiya Kanda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu. A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-4, IEEE, 2017. [doi]

This author has not been identified. Look up 'Michiya Kanda' in GoogleThis author has not been identified. Look up 'Masaki Hashizume' in GoogleThis author has not been identified. Look up 'Hiroyuki Yotsuyanagi' in GoogleThis author has not been identified. Look up 'Shyue-Kung Lu' in Google

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