Michiya Kanda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu. A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.