Michiya Kanda, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu. A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{KandaHYL17,
title = {A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type},
author = {Michiya Kanda and Masaki Hashizume and Hiroyuki Yotsuyanagi and Shyue-Kung Lu},
year = {2017},
doi = {10.1109/DFT.2017.8244446},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2017.8244446},
researchr = {https://researchr.org/publication/KandaHYL17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0362-8},
}