Voltage-controlled MRAM for working memory: Perspectives and challenges - researchr publication authors

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Wang Kang, Liang Chang, Youguang Zhang, Weisheng Zhao. Voltage-controlled MRAM for working memory: Perspectives and challenges. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 542-547, IEEE, 2017. [doi]

This author has not been identified. Look up 'Wang Kang' in GoogleThis author has not been identified. Look up 'Liang Chang' in GoogleThis author has not been identified. Look up 'Youguang Zhang' in GoogleThis author has not been identified. Look up 'Weisheng Zhao' in Google

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