Voltage-controlled MRAM for working memory: Perspectives and challenges

Wang Kang, Liang Chang, Youguang Zhang, Weisheng Zhao. Voltage-controlled MRAM for working memory: Perspectives and challenges. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 542-547, IEEE, 2017. [doi]

Abstract

Abstract is missing.