Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams. A weighted random pattern test generation system. IEEE Trans. on CAD of Integrated Circuits and Systems, 15(8):1020-1025, 1996. [doi]
@article{KapurPSW96,
title = {A weighted random pattern test generation system},
author = {Rohit Kapur and Srinivas Patil and Thomas J. Snethen and Thomas W. Williams},
year = {1996},
doi = {10.1109/43.511581},
url = {http://doi.ieeecomputersociety.org/10.1109/43.511581},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/KapurPSW96},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {15},
number = {8},
pages = {1020-1025},
}