Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology - researchr publication authors

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Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh. Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 320-325, IEEE, 2017. [doi]

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