The following publications are possibly variants of this publication:
- Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defectAmit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell. latw 2016: 129-134 [doi]
- Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditionsAmit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh. ets 2017: 1-2 [doi]
- Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET TechnologiesAmit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell. et, 33(4):515-527, 2017. [doi]
- Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologiesAmit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell. latw 2018: 1-5 [doi]
- Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI TechnologiesAmit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell. et, 35(1):59-75, 2019. [doi]