Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology

Amit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh. Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 320-325, IEEE, 2017. [doi]

@inproceedings{KarelACGRS17-0,
  title = {Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology},
  author = {Amit Karel and Florence Azaïs and Mariane Comte and Jean Marc Gallière and Michel Renovell and Keshav Singh},
  year = {2017},
  doi = {10.1109/ISVLSI.2017.63},
  url = {https://doi.org/10.1109/ISVLSI.2017.63},
  researchr = {https://researchr.org/publication/KarelACGRS17-0},
  cites = {0},
  citedby = {0},
  pages = {320-325},
  booktitle = {2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-6762-6},
}