Amey Karkare, Manoj Singla, Ajai Jain. Testability Preserving and Enhancing Transformations for Robust Delay Fault Testabilit. In 11th International Conference on VLSI Design (VLSI Design 1991), 4-7 January 1998, Chennai, India. pages 370-373, IEEE Computer Society, 1998. [doi]
Abstract is missing.