Design for testability in nano-CMOS analog integrated circuits using a new design analog checker - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Mouna Karmani, Ka Lok Man, Chiraz Khedhiri, Belgacem Hamdi. Design for testability in nano-CMOS analog integrated circuits using a new design analog checker. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 317-320, IEEE, 2011. [doi]

This author has not been identified. Look up 'Mouna Karmani' in GoogleThis author has not been identified. Look up 'Ka Lok Man' in GoogleThis author has not been identified. Look up 'Chiraz Khedhiri' in GoogleThis author has not been identified. Look up 'Belgacem Hamdi' in Google

runs on WebDSL