Mouna Karmani, Ka Lok Man, Chiraz Khedhiri, Belgacem Hamdi. Design for testability in nano-CMOS analog integrated circuits using a new design analog checker. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 317-320, IEEE, 2011. [doi]
@inproceedings{KarmaniMKH11,
title = {Design for testability in nano-CMOS analog integrated circuits using a new design analog checker},
author = {Mouna Karmani and Ka Lok Man and Chiraz Khedhiri and Belgacem Hamdi},
year = {2011},
doi = {10.1109/ISOCC.2011.6138774},
url = {http://dx.doi.org/10.1109/ISOCC.2011.6138774},
researchr = {https://researchr.org/publication/KarmaniMKH11},
cites = {0},
citedby = {0},
pages = {317-320},
booktitle = {International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0709-4},
}