Mouna Karmani, Ka Lok Man, Chiraz Khedhiri, Belgacem Hamdi. Design for testability in nano-CMOS analog integrated circuits using a new design analog checker. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 317-320, IEEE, 2011. [doi]
Abstract is missing.