Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor

N. Kaushik, A. Kranti, Mridula Gupta, R. S. Gupta. Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor. Microelectronics Journal, 34(1):77-83, 2003. [doi]

Authors

N. Kaushik

This author has not been identified. Look up 'N. Kaushik' in Google

A. Kranti

This author has not been identified. Look up 'A. Kranti' in Google

Mridula Gupta

This author has not been identified. Look up 'Mridula Gupta' in Google

R. S. Gupta

This author has not been identified. Look up 'R. S. Gupta' in Google