Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor

N. Kaushik, A. Kranti, Mridula Gupta, R. S. Gupta. Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor. Microelectronics Journal, 34(1):77-83, 2003. [doi]

Abstract

Abstract is missing.