N. Kaushik, A. Kranti, Mridula Gupta, R. S. Gupta. Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor. Microelectronics Journal, 34(1):77-83, 2003. [doi]
@article{KaushikKGG03,
title = {Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor},
author = {N. Kaushik and A. Kranti and Mridula Gupta and R. S. Gupta},
year = {2003},
doi = {10.1016/S0026-2692(02)00140-4},
url = {http://dx.doi.org/10.1016/S0026-2692(02)00140-4},
researchr = {https://researchr.org/publication/KaushikKGG03},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {34},
number = {1},
pages = {77-83},
}