A novel reseeding technique for accumulator-based test pattern generation - researchr publication authors

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Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos. A novel reseeding technique for accumulator-based test pattern generation. In Kaushik Roy, Sung-Mo Kang, Cheng-Kok Koh, editors, Proceedings of the 11th ACM Great Lakes Symposium on VLSI 2001, West Lafayette, Indiana, USA, 2001. pages 7-12, ACM, 2001. [doi]

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