Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos. A novel reseeding technique for accumulator-based test pattern generation. In Kaushik Roy, Sung-Mo Kang, Cheng-Kok Koh, editors, Proceedings of the 11th ACM Great Lakes Symposium on VLSI 2001, West Lafayette, Indiana, USA, 2001. pages 7-12, ACM, 2001. [doi]
@inproceedings{KavousianosBN01,
title = {A novel reseeding technique for accumulator-based test pattern generation},
author = {Xrysovalantis Kavousianos and Dimitris Bakalis and Dimitris Nikolos},
year = {2001},
doi = {10.1145/368122.368145},
url = {http://doi.acm.org/10.1145/368122.368145},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/KavousianosBN01},
cites = {0},
citedby = {0},
pages = {7-12},
booktitle = {Proceedings of the 11th ACM Great Lakes Symposium on VLSI 2001, West Lafayette, Indiana, USA, 2001},
editor = {Kaushik Roy and Sung-Mo Kang and Cheng-Kok Koh},
publisher = {ACM},
isbn = {1-58113-351-0},
}