Wuudiann Ke, Premachandran R. Menon. Path-delay-fault testable nonscan sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 14(5):576-582, 1995. [doi]
@article{KeM95:1,
title = {Path-delay-fault testable nonscan sequential circuits},
author = {Wuudiann Ke and Premachandran R. Menon},
year = {1995},
doi = {10.1109/43.384419},
url = {http://doi.ieeecomputersociety.org/10.1109/43.384419},
tags = {testing},
researchr = {https://researchr.org/publication/KeM95%3A1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {14},
number = {5},
pages = {576-582},
}