An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization - researchr publication authors

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John Keane, S. Venkatraman, Paulo F. Butzen, Chris H. Kim. An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization. IEEE Trans. VLSI Syst., 19(5):787-795, 2011. [doi]

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