John Keane, S. Venkatraman, Paulo F. Butzen, Chris H. Kim. An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization. IEEE Trans. VLSI Syst., 19(5):787-795, 2011. [doi]
@article{KeaneVBK11,
title = {An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization},
author = {John Keane and S. Venkatraman and Paulo F. Butzen and Chris H. Kim},
year = {2011},
doi = {10.1109/TVLSI.2010.2041258},
url = {http://dx.doi.org/10.1109/TVLSI.2010.2041258},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/KeaneVBK11},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {19},
number = {5},
pages = {787-795},
}