David C. Keezer, R. J. Wenzel. Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 94-100, IEEE Computer Society, 1997.
@inproceedings{KeezerW97,
title = {Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test},
author = {David C. Keezer and R. J. Wenzel},
year = {1997},
tags = {testing, C++},
researchr = {https://researchr.org/publication/KeezerW97},
cites = {0},
citedby = {0},
pages = {94-100},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}