David C. Keezer, R. J. Wenzel. Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 94-100, IEEE Computer Society, 1997.
No references recorded for this publication.
No citations of this publication recorded.