Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits

Martin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker. Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. J. Electronic Testing, 17(1):37-51, 2001. [doi]

Authors

Martin Keim

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Nicole Drechsler

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Rolf Drechsler

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Bernd Becker

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