Martin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker. Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. J. Electronic Testing, 17(1):37-51, 2001. [doi]
@article{KeimDDB01,
title = {Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits},
author = {Martin Keim and Nicole Drechsler and Rolf Drechsler and Bernd Becker},
year = {2001},
doi = {10.1023/A:1011193725824},
url = {http://dx.doi.org/10.1023/A:1011193725824},
tags = {testing},
researchr = {https://researchr.org/publication/KeimDDB01},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {1},
pages = {37-51},
}